A Higher Order Dynamic Element Matching Using Vector Mismatch Shaping

25/11/2015 - 15:00 - 16:00

In the modern world where almost everything is done in the digital domain, reliable high definition data acquisition methods are required. One of such methods is the Δ-Σ modulator (DSM). Though, theoretically DSMs can achieve very high sampling resolutions, their development and usage are limited due to manufacturing mismatches that cause the built-in multibit Digital to Analog Converter (DAC) to be unusable.
Dynamic Element Matching (DEM) techniques that exist can manipulate the DAC's operation in such a way, that the interferences that are caused by the manufacturing imperfections, are filtered out of the signal-band and do not disturb the data acquisition process. DEM methods are a powerful tool in the design of higher resolution ΔΣ data converters. These tools, to date, were limited to 1st and 2nd order, which didn’t allow the development of higher order multibit modulators.
This work presents a way to overcome the stability issues of the traditional Vector-Mismatch Shaping (VMS) DEM technique, and provides the reader with design considerations and simulation results of higher order DEM.
 * M.Sc. student at the Faculty of Engineering

Alexander Lavzin
דוא"ל להרשמה: 
Faculty of Engineering, Bar-Ilan University
Engineering Building 1103, Room 329