זליגת מידע השמור בזיכרון SRAM באמצעות אנליזה של פליטת אור

Recovering secrets stored in SRAM memory by Photonic Emission Analysis

תיאור הפרויקט ותכולתו:

Simple static infra-red emission analysis is a very powerful method to evaluate logic states in VLSI parts. When CMOS transistors are in off state very faint photonic emission is emanating from the transistor, this emission could be recorded. The emission indicates that the transistor is in the off state, thus the logic state of the gate could be recovered. There were several attempts to harness this emission for side channel analysis of cryptographic gates and recovering secrets using this method. In this project we will attempt to recover data stored in SRAM memory cells by measuring the emission of these cells. Parallel to the attack development we will also try to evaluate methods to confuse the attacker by dummy emission sites or obscured topology. This project will enable the student experience in measurements on the nanoscale level using advances infrared emission microscope. The student will also gain experience in hardware security and sensitivity of hardware to side channel attacks.

דרישות:

הסטודנט נדרש לבצע סימולציות בכלי תכנון ואנליזות ב Matlab
לבצע מדידות על רכיבים
קורס ומעבדה במעגלים משולבים. רצוי קורס במעגלים אנלוגיים

מקורות:

אין

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